전계방사형 주사전자현미경
Submitted by rnd_admin on Tue, 10/22/2024 - 00:10
ename_ko:
전계방사형 주사전자현미경
ename_en:
FE-SEM
emodel:
MERLIN Compact
institution:
신소재공동연구소
location:
관악 신소재공동연구소
(37동 108호)
epname:
이재연
tel:
02-880-4087
email:
jy216@snu.ac.kr
link:
https://riam.snu.ac.kr/sub.php?code=ZESrM6&dong=&mode=view&serial=52
keyword:
nano structures and materials for visual inspection, particle analysis,
nanotechnology, metallography and surface measurement.
· Image highly resolved topographical surface structures with high contrast
and low noise
· Image highly resolved compositional distribution of challenging samples
· Image contrast between composition and its derivate, and contrast
of solid states between their different phases using the unique filtering
technique
· Image magnetic samples with high resolution and no image distortions
· Voltage range : 1kV ~ 20kV
Detector
1) Secondary electron detector
2) Backscattered electron detector
3) Energy dispersive X-ray detector
code:
riam_SEM05