X-선 회절 분석기

원리 X선 회절 현상을 이용하여 물질의 결정상 분석, 미지시료의 정성분석, 혼합시료의 정량분석, 결정화도, 격자변형 분석 기기활용 1) XRD, GIXRD, XRR 측정을 통한 물질 상분석, 구조분석, 박막 두께 분석 2) In-situ 온도 XRD: -190~600 ℃ (사전협의 필요) 3) In-situ 전기화학 XRD: 코인셀 충방전에 따른 XRD 측정 (사전협의 필요) 사양 - Available anodes: Cu, Mo - Goniometer accuracy: Δ2θ ≤ 0.007° determined on NIST SRM 1976X - Beam divergence: <0.023° at 40 mm - TRIO Optics : Software push-button switch between : Motorized Divergence Slit (Bragg-Brentano) : High Intensity Parallel Beam - High-Resolution Monochromators : Ge(220) and Ge(004) reflection2-bounce monochromator - Detector : Active area: 2978 mm² : Maximum count rate: 3.6×10⁸ ph/s/mm² : Spatial resolution: 75 μm : Optimize for γ or 2θ coverage: 0°/90° switchable : Multi-mode (0D/1D/2D) detector based on the hybrid photon counting - In-situ XRD : Temperature: -190 to 600 ℃ (LN₂) : Electrochemical potential: ±1 A to ±10 mA (resolution: 0.004 %)/±2.5, 5, 10 V(resolution: 0.0015%) - Pathfinder plus optics : Software push-button switch between: : Motorized Slit : 2-bounce Ge Analyzer : Automated absorber integrated - Powder stage : 9 rotational powder stage (automated) - Vacuum chuck stage : x,y for sample translation of up to +/- 150 mm : z-Drive with travel of up to 50 mm : Phi drive with infinite rotation : Max. Psi inclination up to 55° - Centric Eulerian Cradle (CEC) : Five degrees of freedom sample stage: : x,y for sample translation of +/-40 mm : z-Drive for height alignment : Phi drive with 360° rotation : Psi drive and angular range from -11° to 98° : Various stage attachment available.